The estimation of microchip testing process duration based on extended fault injection method

The need of adding some kind of fault tolerance to modern microchip design is of great importance today, both for aerospace and sea level applications. It is mostly explained by the increased sensitivity to negative environmental factors due to technology shrinks and because of the need of chip yield increasing in the presence of manufacturing defects. This article discusses an algorithm for assessing microchip design fault tolerance, based on the extended fault injection method.